Super-Resolution Fluorescence Microscopy by Structured Light
... microscope enabled the development of methods for resolution ...
... microscope enabled the development of methods for resolution ...
Cristaux Photoniques, PO-014 Ecole doctorale photonique Romuald
... Quantitative measurement Note: it is not easy to measure directly reflectivity coefficients close to unity This would imply being able to discriminate between e.g. R=0.999 and R=0.997 Usually much more convenient to use the mirror to make a high Q optical cavity and deduce R from Q ...
... Quantitative measurement Note: it is not easy to measure directly reflectivity coefficients close to unity This would imply being able to discriminate between e.g. R=0.999 and R=0.997 Usually much more convenient to use the mirror to make a high Q optical cavity and deduce R from Q ...
09Optics
... sharper; more pronounced: – Maxima are located by the same geometry as used for Young’s double slit: sinθ = mλ/d; m=0, 1, 2, 3, … – Edges of wider two-slit peaks are removed by destructive interference by light coming through slits much further ...
... sharper; more pronounced: – Maxima are located by the same geometry as used for Young’s double slit: sinθ = mλ/d; m=0, 1, 2, 3, … – Edges of wider two-slit peaks are removed by destructive interference by light coming through slits much further ...
lab9 - University of Puget Sound
... What happens to a well-focused image when a portion of the lens is blocked? Does the left side of the image disappear when the left half of the lens is covered? Or the right half, or what? Explain your observations. Describe what happens when the object distance is less than the focal length. Can yo ...
... What happens to a well-focused image when a portion of the lens is blocked? Does the left side of the image disappear when the left half of the lens is covered? Or the right half, or what? Explain your observations. Describe what happens when the object distance is less than the focal length. Can yo ...
Compact Beam Steering
... enabled us to assess system performance in terms of optical transmission, tracking bandwidth, Size, Weight and Power (SWaP) and steering accuracy. Due to the success of the sing-wavelength breadboard system, in Phase II we were able to move on to an achromatic Risley prism beam steering design. When ...
... enabled us to assess system performance in terms of optical transmission, tracking bandwidth, Size, Weight and Power (SWaP) and steering accuracy. Due to the success of the sing-wavelength breadboard system, in Phase II we were able to move on to an achromatic Risley prism beam steering design. When ...
optics(conceptuals)
... Why is no interference pattern observed when two coherent sources are (i) infinitely close to each other? (ii) far apart from each other? (i) What type of waves show the property of polarization? (ii) Unpolarised light of intensity I0 is passed through a Polaroid. What is the intensity of the light ...
... Why is no interference pattern observed when two coherent sources are (i) infinitely close to each other? (ii) far apart from each other? (i) What type of waves show the property of polarization? (ii) Unpolarised light of intensity I0 is passed through a Polaroid. What is the intensity of the light ...
Basic Laboratory Materials Science and Engineering Scanning Electron Microscopy
... surrounding medium, and a short distance to the sample (hereinafter also referred to as "specimen") (wide angle α). When normal light-optical microscopes are used, the surrounding medium is air (μ = 1) and the distance between sample and lens cannot be decreased at discretion. For this reason, the m ...
... surrounding medium, and a short distance to the sample (hereinafter also referred to as "specimen") (wide angle α). When normal light-optical microscopes are used, the surrounding medium is air (μ = 1) and the distance between sample and lens cannot be decreased at discretion. For this reason, the m ...
5.3 Optical Components Conventional Light Sources 5.3.1 Light Sources
... pumped by X-rays produced by a nuclear explosion (no joke). They would not live long but still be able to produce a short-lived ultra-high intensity Laser beam suitable for shooting down missiles. Our cheap, simple and long-lasting semiconductor lasers, in contrast, are "simply" pumped by running a ...
... pumped by X-rays produced by a nuclear explosion (no joke). They would not live long but still be able to produce a short-lived ultra-high intensity Laser beam suitable for shooting down missiles. Our cheap, simple and long-lasting semiconductor lasers, in contrast, are "simply" pumped by running a ...
Quantitative evaluation of light microscopes based on image
... The calibration of the illumination starts with an intensity check for which the results are shown in table 1. The microscope lamps are centered and focused by using the Köhler procedures as described in the respective manuals of the microscopes. In this study 40× objectives are used. The standard ...
... The calibration of the illumination starts with an intensity check for which the results are shown in table 1. The microscope lamps are centered and focused by using the Köhler procedures as described in the respective manuals of the microscopes. In this study 40× objectives are used. The standard ...
Structure and optical properties of reconstructed Si and Ge surfaces
... reconstruction. Systems with reconstructed surfaces can exhibit completely different electronic and optical properties than bulk. They may also produce structural anisotropy. A combination of optical experimental measurements and computer simulations may be used to identify those special structures ...
... reconstruction. Systems with reconstructed surfaces can exhibit completely different electronic and optical properties than bulk. They may also produce structural anisotropy. A combination of optical experimental measurements and computer simulations may be used to identify those special structures ...
Abstract
... Measurements of the small wave tilt using the optical vortex interferometer with the Wollaston prism Agnieszka Popiołek-Masajada, Piotr Kurzynowski, Władysław A. Woźniak, Monika Borwińska, Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland ...
... Measurements of the small wave tilt using the optical vortex interferometer with the Wollaston prism Agnieszka Popiołek-Masajada, Piotr Kurzynowski, Władysław A. Woźniak, Monika Borwińska, Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland ...
Imaging properties of supercritical angle
... in sample and image space, such as Herschel’s condition [3]). Two such optical systems are of particular practical importance: light collection optics using parabolic mirrors [4] or solidimmersion lenses [5]. Such systems are far from being aplanatic, and collect a considerable amount of light above ...
... in sample and image space, such as Herschel’s condition [3]). Two such optical systems are of particular practical importance: light collection optics using parabolic mirrors [4] or solidimmersion lenses [5]. Such systems are far from being aplanatic, and collect a considerable amount of light above ...
optical fiber communication - GTU e
... LEDs are suitable primarily for local-area-network applications with bit rates of 10-100 Mbit/s and transmission distances of a few kilometers. ...
... LEDs are suitable primarily for local-area-network applications with bit rates of 10-100 Mbit/s and transmission distances of a few kilometers. ...
Photon momentum and uncertainty
... In the world of very small particles, one cannot measure any property of a particle without interacting with it in some way This introduces an unavoidable uncertainty into the result One can never measure all the ...
... In the world of very small particles, one cannot measure any property of a particle without interacting with it in some way This introduces an unavoidable uncertainty into the result One can never measure all the ...
The Michelson Interferometer and Its Applications
... constructive interference is observed at the viewing screen as the crests of the two beams overlap, and a bright spot or ring is seen as the viewing screen. ...
... constructive interference is observed at the viewing screen as the crests of the two beams overlap, and a bright spot or ring is seen as the viewing screen. ...
LM Ch 4: Optics
... The curved surface of a lens affects how much a ray of light will be deflected. This is called refraction. For example take two parallel rays of light, one hitting the center of the lens normal to the lens surface and the other hitting the edge of the lens. The center ray will not be refracted by th ...
... The curved surface of a lens affects how much a ray of light will be deflected. This is called refraction. For example take two parallel rays of light, one hitting the center of the lens normal to the lens surface and the other hitting the edge of the lens. The center ray will not be refracted by th ...
Lecture 13: Heisenberg and Uncertainty
... In the world of very small particles, one cannot measure any property of a particle without interacting with it in some way This introduces an unavoidable uncertainty into the result One can never measure all the ...
... In the world of very small particles, one cannot measure any property of a particle without interacting with it in some way This introduces an unavoidable uncertainty into the result One can never measure all the ...
File
... 1.The ray of light must pass from denser to rarer medium . 2. The angle of incidence must be greater than critical angle. (i.e.i>ic) 3.Relation between refractive index and critical angle. by snell’s law sin i/sin r =1/μ or sin c/sin r = 1/μ or sin c /sin 90= 1/μ or sin c = 1/μ or μ = 1/sin c ...
... 1.The ray of light must pass from denser to rarer medium . 2. The angle of incidence must be greater than critical angle. (i.e.i>ic) 3.Relation between refractive index and critical angle. by snell’s law sin i/sin r =1/μ or sin c/sin r = 1/μ or sin c /sin 90= 1/μ or sin c = 1/μ or μ = 1/sin c ...
Tutor 4
... errors, resulting in image degradation. If, however, the angle of illumination were chosen such that, for a given feature, the zero order and one of the first diffraction orders are spaced evenly about the center of the objective lens (Fig. 2), the phase change due to defocus will be the same for b ...
... errors, resulting in image degradation. If, however, the angle of illumination were chosen such that, for a given feature, the zero order and one of the first diffraction orders are spaced evenly about the center of the objective lens (Fig. 2), the phase change due to defocus will be the same for b ...
THERMAL IMAGING OF Si, GaAs AND GaN -BASED DEVICES S. Pavageau
... Thermal imaging of Si, GaAs and GaN -based devices within the Microtherm project under 6 µm of intermetal and encapsulation dielectric were clearly detected with a spatial resolution of 350 nm. This is close to the ultimate resolution limit imposed by diffraction at approximately λ/2N.A.=324 nm, whe ...
... Thermal imaging of Si, GaAs and GaN -based devices within the Microtherm project under 6 µm of intermetal and encapsulation dielectric were clearly detected with a spatial resolution of 350 nm. This is close to the ultimate resolution limit imposed by diffraction at approximately λ/2N.A.=324 nm, whe ...
Harnessing a Quantum Design Approach for Making Low
... The resulting images (Figure 4) show that, contrary to the usual tendencies of diffraction, the image detail sharpens significantly as the wavelength is lengthened (from λ = 9.3 μm to λ = 10.7 μm). At the longer wavelength the QM superlens gives an extremely high quality image; the 0.8 μm diameter dot ...
... The resulting images (Figure 4) show that, contrary to the usual tendencies of diffraction, the image detail sharpens significantly as the wavelength is lengthened (from λ = 9.3 μm to λ = 10.7 μm). At the longer wavelength the QM superlens gives an extremely high quality image; the 0.8 μm diameter dot ...
Nanometer optical coherence tomography using
... [5] Morlens et al.: Study of XUV beam splitter flatness for use on a Michelson interferometer, Laser und Particle Beams. 2004 [6] Vakhtin et al.: Common-Path Interferometer for Frequency-Domain Optical Coherence Tomography, Appl. Optics, 2003 [7] Jasny et al.: A single-shot spectrograph for the soft ...
... [5] Morlens et al.: Study of XUV beam splitter flatness for use on a Michelson interferometer, Laser und Particle Beams. 2004 [6] Vakhtin et al.: Common-Path Interferometer for Frequency-Domain Optical Coherence Tomography, Appl. Optics, 2003 [7] Jasny et al.: A single-shot spectrograph for the soft ...
Comparison of laser scanning methods
... Beam steering (x-y) • An acousto-optics deflector changes the angle of direction of a laser beam and its angular position is linearly proportional to the acoustic frequency, so that the higher the frequency, the larger the diffracted angle. ...
... Beam steering (x-y) • An acousto-optics deflector changes the angle of direction of a laser beam and its angular position is linearly proportional to the acoustic frequency, so that the higher the frequency, the larger the diffracted angle. ...
ppt
... image can be determined by geometry One ray starts at P, follows path PQ and reflects back on itself A second ray follows path PR and reflects according to the Law of Reflection ...
... image can be determined by geometry One ray starts at P, follows path PQ and reflects back on itself A second ray follows path PR and reflects according to the Law of Reflection ...
BMS 631 - Lecture 4
... • If the ray of light travels through a length L of a medium of RI n, the optical path length S=Ln (thus S represents the distance light woul dhave traveled in a vacuum in the same time it took to travel the distance L in the medium (RI n). • Rays diverge (because the come from a point source • Verg ...
... • If the ray of light travels through a length L of a medium of RI n, the optical path length S=Ln (thus S represents the distance light woul dhave traveled in a vacuum in the same time it took to travel the distance L in the medium (RI n). • Rays diverge (because the come from a point source • Verg ...
Microscopy
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy.Optical and electron microscopy involve the diffraction, reflection, or refraction of electromagnetic radiation/electron beams interacting with the specimen, and the collection of the scattered radiation or another signal in order to create an image. This process may be carried out by wide-field irradiation of the sample (for example standard light microscopy and transmission electron microscopy) or by scanning of a fine beam over the sample (for example confocal laser scanning microscopy and scanning electron microscopy). Scanning probe microscopy involves the interaction of a scanning probe with the surface of the object of interest. The development of microscopy revolutionized biology and remains an essential technique in the life and physical sciences.