A study on the nickel(II)
... positive charge of the complex. Moreover, we suggest that two water molecules bind to a Ni(II) ion to fulfil the octahedral coordination sphere that is easily seen by the characteristic colour of the complex. The presence of perchlorate ions is confirmed in FT-IR spectra by the observation of two ch ...
... positive charge of the complex. Moreover, we suggest that two water molecules bind to a Ni(II) ion to fulfil the octahedral coordination sphere that is easily seen by the characteristic colour of the complex. The presence of perchlorate ions is confirmed in FT-IR spectra by the observation of two ch ...
Wavelength swept amplified spontaneous emission source
... wavelength swept light source with high power, low ASE and rapid sweeping operation. It should be underlined that it is not a real laser, since no resonator and optical feedback exists. In order to achieve a sufficient output power level and sensitivity for OCT imaging, ASE light alternately passes ...
... wavelength swept light source with high power, low ASE and rapid sweeping operation. It should be underlined that it is not a real laser, since no resonator and optical feedback exists. In order to achieve a sufficient output power level and sensitivity for OCT imaging, ASE light alternately passes ...
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... microspectroscopy system. The 488 nm line of an Innova Ar+ laser from Coherent Inc. was used as the excitation source. The laser was focused to less than 5 μm on the sample with an average power of 30 mW by an Olympus microscope with a 20× objective. A 15× eyepiece and a digital camera allowed for t ...
... microspectroscopy system. The 488 nm line of an Innova Ar+ laser from Coherent Inc. was used as the excitation source. The laser was focused to less than 5 μm on the sample with an average power of 30 mW by an Olympus microscope with a 20× objective. A 15× eyepiece and a digital camera allowed for t ...
Absence of Evidence ? Evidence of Absence
... coupled with energy dispersive X-ray spectroscopy (EDS/EDX)9 and/ or electron energy loss spectroscopy (EELS)10,11 provide techniques which can resolve single atoms spatially and elementally, but are limited to very small sample volumes (areas of a few nm2 within a single atomic layer such as graphe ...
... coupled with energy dispersive X-ray spectroscopy (EDS/EDX)9 and/ or electron energy loss spectroscopy (EELS)10,11 provide techniques which can resolve single atoms spatially and elementally, but are limited to very small sample volumes (areas of a few nm2 within a single atomic layer such as graphe ...
Introduction to X-ray Absorption Spectroscopy, Extended X
... • XAS can be applied to samples irrespective of physical (solution, powder, frozen solution) or chemical (oxidation, spin) state • Crystals and other oriented systems can be studied, but be aware of the polarization of the synchrotron beam • Even whole organisms can be studied but preferentially the ...
... • XAS can be applied to samples irrespective of physical (solution, powder, frozen solution) or chemical (oxidation, spin) state • Crystals and other oriented systems can be studied, but be aware of the polarization of the synchrotron beam • Even whole organisms can be studied but preferentially the ...
Understanding Microscopy And Filtering Techniques
... resolution and higher precision than what is typically seen with the human eye. There are numerous applications and setups for these microscopes, ranging from the use of standard DIN and JIS objectives to advanced infinity-corrected objectives. Infinity-corrected digital video microscopes can be qui ...
... resolution and higher precision than what is typically seen with the human eye. There are numerous applications and setups for these microscopes, ranging from the use of standard DIN and JIS objectives to advanced infinity-corrected objectives. Infinity-corrected digital video microscopes can be qui ...
Fundamental Limits in Confocal Microscopy
... The data recorded from a confocal microscope will, in the simplest case, be a set of intensity values (usually representing the concentration of fluorophore) for every voxel throughout a 3D volume within the specimen. Though these data may often be displayed as an image, it should always be remember ...
... The data recorded from a confocal microscope will, in the simplest case, be a set of intensity values (usually representing the concentration of fluorophore) for every voxel throughout a 3D volume within the specimen. Though these data may often be displayed as an image, it should always be remember ...
Presentation
... 2) The ratio of obtained frequencies with good accuracy equal to two and remains constant in all measurements, regardless the KCN+SHAM treatment. This indicates the presence of an internal oscillator, which frequency is doubled and shifted in phase, or the two types of oscillators whose frequencies ...
... 2) The ratio of obtained frequencies with good accuracy equal to two and remains constant in all measurements, regardless the KCN+SHAM treatment. This indicates the presence of an internal oscillator, which frequency is doubled and shifted in phase, or the two types of oscillators whose frequencies ...
Stability of Organic Cations in Solution
... and orbital specific photoemission cross sections.15,16 We obtain a I:Pb intensity ratio of 2.9 ± 0.1, in good agreement with the MAPbI3 stoichiometry, and a N:Pb ratio of 1.3 ± 0.1, indicative of the presence of extra nitrogen species in the perovskite matrix, as discussed below. The C:N ratio shows ...
... and orbital specific photoemission cross sections.15,16 We obtain a I:Pb intensity ratio of 2.9 ± 0.1, in good agreement with the MAPbI3 stoichiometry, and a N:Pb ratio of 1.3 ± 0.1, indicative of the presence of extra nitrogen species in the perovskite matrix, as discussed below. The C:N ratio shows ...
THz Materials
... Loss tangent can be calculated using the following formula: tanδ=1/ (ω*εv *ε0*R), where ω circular frequency, εv -dielectric constant of vacuum (8.85*10-12 F/m), ε0- dielectric constant of silicon (11.67), and R specific resistance. For example, loss tangent of HRFZ-Si with resistivity 10 kOhm*cm at ...
... Loss tangent can be calculated using the following formula: tanδ=1/ (ω*εv *ε0*R), where ω circular frequency, εv -dielectric constant of vacuum (8.85*10-12 F/m), ε0- dielectric constant of silicon (11.67), and R specific resistance. For example, loss tangent of HRFZ-Si with resistivity 10 kOhm*cm at ...