Download Dr. Peter Bajorski

www.cis.rit.edu/seminar
for schedule, abstracts,
biographies, and video archives
Dr. Peter Bajorski
Associate Professor
Center for Quality and Applied Statistics and
Center for Imaging Science
Rochester Institute of Technology
Peter Bajorski received the B.S./M.S. degrees in mathematics from the University of
Wroclaw, Poland, and the Ph.D. degree in mathematical statistics from the
Technical University of Wroclaw, Poland. He held positions at Cornell University, the
University of British Columbia, Simon Fraser University, and NY State Department of
Transportation. Currently, he is Associate Professor in the Center for Quality and
Applied Statistics at Rochester Institute of Technology. He is also graduate program
faculty at the Center for Imaging Science. His research interests in remote sensing
include target detection and unmixing in hyperspectral images. Other interests
include multivariate statistical methods, regression techniques, and design of
experiments. Dr. Bajorski is a member of the American Statistical Society, a senior
member of SPIE, and a senior member of IEEE. He is also an author of a book on
Statistics for Imaging, Optics, and Photonics published in Wiley Series in Probability
and Statistics.
4PM, WEDNESDAY, MAY 2, 2012
Carlson Auditorium, Center for Imaging Science (Bldg. 76)