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C. J. Spanos Design of Experiments in Semiconductor Manufacturing Costas J. Spanos Department of Electrical Engineering and Computer Sciences University of California Berkeley, CA 94720, U.S.A. tel (510) 643 6776, fax (510) 642 2739 email spanos@eecs.berkeley.edu http://bcam.eecs.berkeley.edu L2 1 C. J. Spanos Design of Experiments • Comparison of Treatments – which recipe works the best? • Simple Factorial Experiments – to explore impact of few variables • Fractional Factorial Experiments – to explore impact of many variables • Regression Analysis – to create analytical expressions that “model” process behavior • Response Surface Methods – to visualize process performance over a range of input parameter values L2 2 C. J. Spanos Design of Experiments • Objectives: – Compare Methods. – Deduce Dependence. – Create Models to Predict Effects. • Problems: – Experimental Error. – Confusion of Correlation with Causation. – Complexity of the Effects we study. L2 3 C. J. Spanos Problems Solved • Compare Recipes • Choose the recipe that gives the best results. • Organize experiments to facilitate the analysis of the data. • Use experimental results to build process models. • Use models to optimize the process. L2 4 C. J. Spanos Comparison of Treatments • • • • Internal and External References The Importance of Independence Blocking and Randomization Analysis of Variance L2 5 C. J. Spanos The BIG Question in comparison of treatments: • How does a process compare with other processes? – Is it the same? – Is it different? – How can we tell? L2 6 C. J. Spanos Using an External Reference to make a Decision • An external reference can be used to decide whether a new observation is different than a group of old observations. • Example: Create a comparison procedure for lot yield monitoring. Do it without "statistics". • Here, I use "reference data": L2 7 C. J. Spanos Example: Using an External Reference To compare the difference between the average of successive groups of ten lots, I build the histogram from the reference data: • Each new point can then be judged on the basis of the reference data. • The only assumption here is that the reference data is relevant to my test! L2 8 C. J. Spanos Using an Internal Reference... • We could generate an "internal" reference distribution from the data we are comparing. • Sampling must be random, so that the data is independently distributed. • Independence would allow us to use statistics such as the arithmetic average or the sum of squares. • Internal references are based on Randomization. L2 9 C. J. Spanos Example in Randomization • Is recipe A different than recipe B? 660 A B Etch Rate Recipe Type A 650 640 B 620 L2 630 640 650 Etch Rate 660 630 0 2 4 6 8 10 12 Sample 10 C. J. Spanos Example in Randomization - cont. • There are many ways to decide this... 1.External reference distribution based on old data. 2. Approximate external reference distr. (either t or normal). 3. Internal reference distribution. 4. "Distribution free" tests. • Options 2, 3 and 4 depend on the assumption that the samples are independently distributed. L2 11 C. J. Spanos Example in Randomization - cont. • If there was no difference between A and B, then let me assume that I just have one out of the 10!/5!5! (252) arrangements of labels A and B. • I use the data to calculate the differences in means for all the combinations: L2 12 C. J. Spanos The Origin of the t Distribution The student-t distribution was, in fact, defined to approximate randomized distributions! (yB - yA) - (µA - µB) t0 = s n1 + n1 A B • For the etch example, t0 = 0.44 and Pr (t > t0) = 0.34 • Randomized Distribution = 0.33 L2 13 C. J. Spanos Example in Blocking • Compare recipes A and B on five machines. • If there are inherent differences from one machine to the other, what scheme would you use? L2 Random Blocked AA AB ABA BA BA BA BB AB B BA 14 C. J. Spanos Example in Blocking - cont. • With the blocked scheme, we could calculate the A-B difference for each machine. • The machine-to-machine average of these differences could be randomized. d= ±d1±d2±d3±d4±d5 5 d - δ ~ tn-1 sd/ n In randomize what Ingeneral, general, randomize whatyou youdon't don't know know block and what you do know. and block what you do know. L2 15 C. J. Spanos Analysis of Variance Recipe Type 5 D4 C3 B2 A 1 610 620 630 640 Etch Rate 650 660 Your same or YourQuestion: Question:Are Arethe the four fourtreatments treatments the thesame ornot? not? The between TheStatistician's Statistician's Question: Question:Are Are the thediscrepancies discrepancies between the groups greater than the variation withineach the groups greater than the variationwithin eachgroup? group? L2 16 C. J. Spanos Calculations for our Example i=1 650 645 623 645 1: 2: 3: 4: i=2 648 650 628 640 i=3 632 638 630 648 i=4 645 643 620 642 i=5 641 640 618 638 Avg 643.20 643.20 623.80 642.60 s t2 202.80 86.80 104.80 63.20 νt 4 4 4 4 (yt - y)2 25.00 25.00 207.36 19.36 s2R = s2T = s2T = s2R L2 17 C. J. Spanos Variation Within Treatment Groups First, lets assume that all groups have the same spread. Lets also assume that each group is normally distributed. The following is used to estimate their common σ: nt St = Σ (ytj - yt)2 s2t = St nt - 1 j=1 2 ν s +ν s2+...+ νks2k s2R = 1 1 2 2 ν1 + ν2 +...+ νk = SR = SR N - k νR • This is an estimate of the unknown, within group s square. • It is called the within treatment mean square L2 18 C. J. Spanos Variation Between Treatment Groups • Let us now form Ho by assuming that all the groups have the same mean. • Assuming that there are no real differences between groups, a second estimate of sT2 would be: k Σ s2T = t=1 nt(yt - y)2 k-1 = ST νT This is the between treatment mean square IfIf all all the the treatments treatments are are the the same, same, then then the the within within and and between treatment mean squares are estimating the same same between treatment mean squares are estimating the number! number! L2 19 C. J. Spanos What if the Treatments are different? If the treatments are different then: s2T estimates σ2 + k Σ nt τ2t / (k - 1) t=1 where τt ≡ µt - µ • In other words, the between treatment mean square is inflated by a factor proportional to the difference between the treatments! L2 20 C. J. Spanos Final Test for Treatment Significance Therefore, the hypothesis of equivalence is rejected if: s2T is significantly greater than 1.0 s2R This can be formalized since: s2T ~ Fk-1, N-k s2R L2 21 C. J. Spanos More Sums of Squares A measure of the overall variation: k SD = Σ nt Σ t=1 j=1 (ytj - y)2 s2D = SD = SD N - 1 νD Obviously (actually, this is not so obvious, but it can be proven): SD = ST + SR and ν D = ν T + ν R L2 22 C. J. Spanos ANOVA Table Source of Var Sum of sq DFs Mean sq between within ST SR vT (k-1) vR (N-k) sT sR2 total SD vD (N-1) sD 2 2 L2 23 C. J. Spanos ANOVA Table (full) L2 Source of Var Sum of sq DFs average between within SA ST SR vA ( 1 ) vT (k-1) vR (N-k) total S v (N) Mean sq 2 sA s2T s2R 24 C. J. Spanos Anova for our example... Data File: CompEtch Sum of Deg. of Squares Freedom Source Between Recipe Mean Squares 1.3836e+3 3 4.6120e+2 Error 4.5760e+2 16 2.8600e+1 Total 1.8412e+3 19 F-Ratio Prob>F 1.6126e+1 4.29e-5 L2 25 C. J. Spanos Decomposition of Observations Y=A+T+R In Vector Form: yti . . . N y = . . . 1 yt - y + . . . k-1 yti - yt + . . . N-k The term degrees of freedom refers to the dimensionality of the space each vector is free to move into. L2 26 C. J. Spanos Geometric Interpretation of ANOVA Y=A+D Easy to prove that A ⊥ D. D = R +T Easy to prove that R ⊥ T and A ⊥ R. Y D R Y T A L2 27 C. J. Spanos Model and Diagnostics yti = µt + eti So, the "sufficient statistics" are: s2R, y1, y2,..., yk as estimators of: σ 2, µ1, µ2,..., µk yt For our example: A: B: C: D: L2 eti ~ N (0, σ 2) 643.20 643.20 623.80 642.60 According Accordingto to this thismodel, model,the the residuals residuals are areIIND. IIND.How Howdo doyou you verify that? verify that? s2R 28.6 28 C. J. Spanos Anova Example: Poly Deposition t h i c k 200 190 180 170 160 150 140 130 120 110 100 90 80 70 60 50 E Recipe B C D A F Are these recipes significantly different? Analysis of Variance Source Model Error C Total DF 5 227 232 Sum of Squares 26969.525 58418.758 85388.283 F Ratio 20.9593 Prob > F 0.0000 Mean Square 5393.91 257.35 L2 29 C. J. Spanos Residual Plots: Residual thick. 100 0.4 75 0.3 50 25 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 0.2 0.1 90 Residual thick. 25 0.75 20 15 0.5 10 0.25 5 -40 -30 -20 -10 0 10 20 30 40 Residual thick. 40 0.6 30 0.4 20 0.2 10 -40 -20 -10 0 10 20 30 40 50 60 Residual thick. 30 20 10 L2 -40 -30 -20 -10 0 10 20 30 40 50 0.6 0.4 0.2 30 C. J. Spanos Residual Plots (cont): R e s i d u a l t h i c k . 90 80 70 60 50 40 30 20 10 0 -10 -20 -30 -40 E B C D Deposition Recipe E F V1 V2 Wafer Vendor L2 31 C. J. Spanos Anova Summary • • • • Plot Originals Construct ANOVA table Are the treatment effects significant? Plot residuals versus: – – – – treatment group mean time sequence other? • ANOVA is the basic tool behind most empirical modeling techniques. (chapter 6 in BHH) L2 32