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Scanning Electron Microscopy / Electron Probe X
Scanning Electron Microscopy / Electron Probe X

... most important contrast mechanism of backscattered electrons is the dependence of the backscattering coefficient on the mean atomic number: regions with higher atomic number elements appear brighter than lower atomic number elements in the BSE image. This allows phases with differences in atomic num ...
Primary electrons make random elastic and inelastic collision either
Primary electrons make random elastic and inelastic collision either

... Characteristic X-ray emission is that generated by the relaxation of an excited atomic state arising from an inner shell vacancy. The transition of an electron from one of the outer shells produces an X-ray phonon with an energy (or wavelength) that represents the difference between the two states…. ...
FYS0460 / FYSZ460 Ohjelmatyö Elektronisuhkulitografia
FYS0460 / FYSZ460 Ohjelmatyö Elektronisuhkulitografia

No Slide Title
No Slide Title

... x-rays resolved by diffraction, through a regular periodic solid, to a gas-filled counter ...
< 1 ... 26 27 28 29 30

Reflection high-energy electron diffraction



Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.
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