Instruction Manual
... contact with the chassis. Metal labels or incidental conductive hardware should not be used for this test. Once connection is made, rotate the FUNCTION switch (7) to read RESISTANCE, and read its value directly in ohms. This test is best made with the POLARITY switch in the OFF position. ...
... contact with the chassis. Metal labels or incidental conductive hardware should not be used for this test. Once connection is made, rotate the FUNCTION switch (7) to read RESISTANCE, and read its value directly in ohms. This test is best made with the POLARITY switch in the OFF position. ...
G/TBT/N/CHN/1184 - 1 - NOTIFICATION The following notification is
... The following notification is being circulated in accordance with Article 10.6 ...
... The following notification is being circulated in accordance with Article 10.6 ...
TGA4706-FC:
... the automotive RADAR market. The TGA4705-FC is designed using TriQuint’s proven 0.13 μm pHEMT process and front-side Cu / Sn pillar technology for reduced source inductance and superior noise performance at frequencies of 72 – 80 GHz. Die reliability is enhanced by using TriQuint’s BCB polymeric pas ...
... the automotive RADAR market. The TGA4705-FC is designed using TriQuint’s proven 0.13 μm pHEMT process and front-side Cu / Sn pillar technology for reduced source inductance and superior noise performance at frequencies of 72 – 80 GHz. Die reliability is enhanced by using TriQuint’s BCB polymeric pas ...
CP9815
... elbows and insulated protective caps on circuits with little or no load current. The cause of most of these flashovers has been attributed to what has been called the partial vacuum effect. Partial vacuum flashovers can be identified by tick marks at the back end of the probe. The flashovers occur a ...
... elbows and insulated protective caps on circuits with little or no load current. The cause of most of these flashovers has been attributed to what has been called the partial vacuum effect. Partial vacuum flashovers can be identified by tick marks at the back end of the probe. The flashovers occur a ...
EVALUATION AND DESIGN SUPPORT
... (Continued from first page) Circuits from the Lab circuits are intended only for use with Analog Devices products and are the intellectual property of Analog Devices or its licensors. While you may use the Circuits from the Lab circuits in the design of your product, no other license is granted by i ...
... (Continued from first page) Circuits from the Lab circuits are intended only for use with Analog Devices products and are the intellectual property of Analog Devices or its licensors. While you may use the Circuits from the Lab circuits in the design of your product, no other license is granted by i ...
Altera Cyclone® V-based System on Module
... Altera Cyclone® V SOC. The SOC integrates a dual-core ARM Cortex®-A9 processor (HPS), peripherals and memory controllers with a large FPGA fabric. Using the FPGA’s configurable logic, the Spark enables unlimited possibilities to add customized accelerators and virtually any peripheral set, giving th ...
... Altera Cyclone® V SOC. The SOC integrates a dual-core ARM Cortex®-A9 processor (HPS), peripherals and memory controllers with a large FPGA fabric. Using the FPGA’s configurable logic, the Spark enables unlimited possibilities to add customized accelerators and virtually any peripheral set, giving th ...
UNIVERSAL DIGITAL VOLTMETER
... optional add-on resistors. The two-stick design can be used in both overhead and underground applications. The DVM-80UVM incorporates Phase Accurate Technology, which makes all voltage readings, whether made from line-to-line or line-to-ground, accurate and repeatable to within 1%. ...
... optional add-on resistors. The two-stick design can be used in both overhead and underground applications. The DVM-80UVM incorporates Phase Accurate Technology, which makes all voltage readings, whether made from line-to-line or line-to-ground, accurate and repeatable to within 1%. ...
Performing locked rotor test on squirrel cage motors
... Methodology During the test the rotor is blocked and the stator supplied with low voltage so as to avoid excessive currents. Tests should be performed under the same conditions of rotor current and frequency that will occur during normal operating conditions. The IEEE recommends using 25 % of the ra ...
... Methodology During the test the rotor is blocked and the stator supplied with low voltage so as to avoid excessive currents. Tests should be performed under the same conditions of rotor current and frequency that will occur during normal operating conditions. The IEEE recommends using 25 % of the ra ...
A Built In IDDQ Testing Circuit
... (4) TIMA Laboratory, 46 Av. Fėlix Viallet, 38031Grenoble, France ...
... (4) TIMA Laboratory, 46 Av. Fėlix Viallet, 38031Grenoble, France ...
2SK209 Audio Frequency Low Noise Amplifier Applications
... · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOS ...
... · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOS ...
EVS-09-04e
... generate a list of safety risk areas that the BMS might experience during charging. This analysis identified 5 general areas to which safety risks can occur before, during, and after DC charging. These areas include: System Grounding, 12V BMS Network Control, High Voltage, Environmental Effects, and ...
... generate a list of safety risk areas that the BMS might experience during charging. This analysis identified 5 general areas to which safety risks can occur before, during, and after DC charging. These areas include: System Grounding, 12V BMS Network Control, High Voltage, Environmental Effects, and ...
EVALUATION AND DESIGN SUPPORT
... Power for the upstream USB connector is derived from the 5 V VBUS voltage available on the USB cable. The hub chip must provide all of the signals and pull-up or pull-down resistors that would be required if the ADuM4160 were not present. The hub chip chosen is an SMSC USB2512 two-port USB hub contr ...
... Power for the upstream USB connector is derived from the 5 V VBUS voltage available on the USB cable. The hub chip must provide all of the signals and pull-up or pull-down resistors that would be required if the ADuM4160 were not present. The hub chip chosen is an SMSC USB2512 two-port USB hub contr ...
What you need to know about input impedance - Techni-Tool
... GFCIs are also used to protect the control circuits in manufacturing facilities where moisture is commonly present. Lost production and damaged product can result if a GFCI is inadvertently tripped in a control panel and equipment stops running. Note that low impedance test tools do not cause trippi ...
... GFCIs are also used to protect the control circuits in manufacturing facilities where moisture is commonly present. Lost production and damaged product can result if a GFCI is inadvertently tripped in a control panel and equipment stops running. Note that low impedance test tools do not cause trippi ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.